这款仪器的设计目的是对航空航天制造业、汽车工业等的关键性工业部件、焊接部件进行高速检测。可整合到其它检测系统中使用，通过GE DFO P3TF22、P3TF30、P3TF31和P3TF35验证。
- Component testing
- Aerospace manufacturing
- Automobile industry
- Welded components
- Integrated inspection systems
- GE DFO P3TF22, P3TF30, P3TF31, and P3TF35 qualified
The OmniScan® iX is an
industrial ultrasonic flaw detector system designed for the high-speed testing
of critical industrial components.
The compact OmniScan iX is housed in a rugged benchtop casing and is also
available in a rack-mount version or with a swivel-arm assembly for easy
integration into a production system.
The OmniScan iX is
central to your industrial component testing system.Olympusprovides all the software libraries required to enable the integrator to tie in
your existing process control system.
In addition, we provide the user interface ports necessary to connect a
display, keyboard, mouse, and external storage. The real-time programmable
alarm and analog outputs, and the encoder outputs, enable easy integration of
the mechanical and electronic components of your industrial process.
All that is needed for rapid and efficient component testing is built-in!
- Data storage capability (internal and external)
- Strip chart display
- 16 real-time alarms
- 16 real-time analog outputs (at PRF)
- 4 digital inputs
- Remote control from PC
- Multiple A-scans
- A-scan and C-scan imaging
- 19-in., 5U rack-mount version
- TomoView™-compatible for data analysis only
- Remote control functions, for custom programming
- 2-axis mechanical encoders
- Multiple scan modes, including helicoidal
- Multiple channels (up to 8)
- TCG/DAC curves
- Interface gate for immersion testing
- Touch screen
- VGA output
- Maximum PRF is equal to the PRF pided by the number of channels (up to 12 kHz)
- USB ports for keyboard, mouse, printer, and external storage
- Back-wall echo attenuator (available at the end of 2006)
Complete Integrated Solution
- Affordable price
- Rugged construction for industrial environment with rack-mount option
- Remote control functions, for custom programming from PC
- Optional data library to access A-scan and/or C-Scan on PC, for custom processing
Software Features
Strip Chart View
- Each channel can have unique setups for multizone inspection.
- Surface following interface gate
- Built-in strip chart display and data storage
- Multiple A-scans
- A-scan and C-scan imaging
- TCG curves
- Multiple scan modes, including helicoidal
- Back-wall echo attenuator (available at the end of 2006)
- Monitoring of amplitude, peak position, crossing-level position, and thickness on each gate
- Automatic gate synchronizes from previous gate for higher dynamic range of thickness.
- A-scan data storage and C-scan postprocessing capabilities
- Interface gate for surface following synchronization of measurement gate and/or TCG/DAC curves
- Either positive or negative gate on RF signal (independent for each gate)
- 16 alarms completely configurable on single-gate events or multiple-gate events, filter for n occurrences from one or multiple channels
- Customizable color palette for amplitude and thickness C-scan
- 60 Hz A-scan refresh rate with overlays of envelope and peak inside the gate
