We adopt integrating spheres for special measurements as essories for common spectrophotometers in the UV-VIS-NIR wavelength range or for Fourier-Transform Infrared Spectrometers. Automated switching between sample and reference can be realised.
Integrating spheres equipped with CCD and/or NIR-diode arrays allow fast measurements in the UV-VIS-NIR range. Such devices are applicable for i-line production control in coating machines, especially