The STI Testers 5300E provide high throughput and superb performance at an exceptionally low cost. Windows®© based software used to efficiently and intuitively program device tests, capture test data and manipulate the captured data (including wafer mapping and delta testing). STI semiconductor testers are in use worldwide for production, quality control and final test. Specifications:Same Proven Technology as all 5000 Series TestersHigh Speed Single Test MeasureCapable of Testing Multiple and Mixed Devices1KV Standard, 2KV Optional1NA to 50A Standard, 100A Optional0.1NA ResolutionComplete Self TestAuto-CalibrationRDSON to 0.1MOHM ResolutionWindows® Application SoftwareOptional ScannerOptional Wafer MappingOptional Curve TraceMOSFET, IGBT, J-FET
Triac, SCR, Sidac, Diac, Quadrac, STS, SBS
Transistor, Diode, Opto, Zener
Regulator, MOV, RelayFast Data Capture
