Part Number | Chip | ||
TJ-113QWC-C8 | Material | Emitting Color | Lens Color |
GaN | White | Water Clear |
Item 项目 | Symbol 代号 | Absolute Maximum Rating 极限工作参数 | Unit 单位 |
Forward Current 正向电流 | IF | 20 | mA |
Peak Forward Current 瞬间脉冲电流 | IFP | 50 | mA |
ReverseVoltage 反向电压 | VR | 5 | V |
Power Dissipation 消耗功率 | PD | 100 | mw |
Electrostatic discharge 静电释放 | ESD | 1000 | V |
Operation Temperature 工作温度范围 | TOPR | -40~+80 | ℃ |
Storage Temperature 存放温度范围 | TSTG | -40~+100 | ℃ |
Lead Soldering Temperature 最高焊接温度 | TSOL | 230 ℃ for 3sec Max。 |
Item 项目 | Symbol 代号 | Condition 测试条件 | Min 最小值 | Typ 典型值 | Max 最大值 | Unit 单位 |
Forward Voltage 正向电压 | VF | IF=20mA | 3.0 | 3.2 | 3.4 | V |
Reverse Current 逆向电流 | IR | VR=5V | 0 | 2 | 5 | uA |
Light intensity 光强度 | IV | IF=20mA | 700 | 800 | 1000 | mcd |
Viewing Angle 半光全角 | 2θ1/2 | IF=20mA | 60 | deg | ||
Luminous Flux 光通量 | Φ | IF=20mA | 1.5 | 2 | 3 | lm |
Waveleng 波长 | WD | IF=20mA | 465 | 468 | 470 | nm |
Recommend Forward Current 持续正向电流 | IF(rec) | IF=20mA | 20 | mA |
Test Classification | Test Item | Test Conditions | Test Duration | Sample QTY | AC/RE |
Life Test | Room Temperature DC Operating Life Test | Ta=25℃±5℃,IF=20mA | 1000 hrs | 30pcs | 0/1 |
Environment Test | Thermal Shock Test | -10℃±5℃←→+100℃±5℃ 5min. 10sec. 5min. | 50 cycles | 30 pcs | 0/1 |
Temperature Cycle Test | -40℃±5℃←→25℃±5℃←→+85℃±5℃ 30min. 5min. 30min. | 50 cycles | 30 pcs | 0/1 | |
High Temperature & High Humidity Test | Ta=85℃±5℃ RH =85%±0.5 %RH | 1000 hrs | 30 pcs | 0/1 | |
High Temperature Storage | Ta=100℃±5℃ | 1000 hrs | 30 pcs | 0/1 | |
Low Temperature Storage | Ta=-55℃±5℃ | 1000 hrs | 30 pcs | 0/1 | |
Mechanical Test | Resistance to Soldering Heat | Ta=230℃±5℃ | 5sec. | 30 pcs | 0/1 |
Lens Integrity | Load 2.5N(0.25kgf) 0° ~ 90° ~0° | 3times | 30 pcs | 0/1 |