产地： 法国
AP204XB、AP205XA系列超高分辨率光谱分析仪基 于内置TLS干涉原理， 波长分辨率可达0.16pm，是普通光谱仪（10pm）的62倍，波长精度3pm，Close in动态范围 40dB@+/-1pm。
技术参数
velength measurement range | 1525nm to 1607nm (Ref :AP2041B) |
1520nm to 1630nm (Ref : AP2043B) |
1526nm to 1567nm (Ref :AP2050A) |
1567nm to 1607nm (Ref : AP2052A) |
1526nm to 1607nm (Ref : AP2051A) |
Wavelength absolute accuracy | +/-3pm |
Wavelength resolution (at 3dB) | 5MHz (0.04pm) and 100MHz (0.8pm) (Ref
:AP204xBseries) |
20MHz (0.16pm) to 2THz (16nm) (Ref
:AP205xBseries) |
Measurement level range | -70dBm to +10dBm |
Absolute level accuracy | +/-0.3dB |
Level repeatability (Typ.) | +/-0.2dB |
Close-in dynamic range | >40dB @ +/-1pm and >60dB @ +/-3pm (Ref
:AP204xBseries) |
>40dB @ +/-2pm and >50dB @ +/-6pm (Ref
:AP205xBseries) |
Sweep time | 5s for 55nm |
1s for 1.2nm |
Optical input | FC/PC for SM fiber |
Tunable laser output | >-7dBm (Ref :AP204xBseries) |
>-8dBm (Ref :AP205xBseries) |
Internal absolute wavelength calibrator | Yes |
