★Features
★Application
★Outline Dimensions
NOTES:
★Absolute Maximum Ratings (Ta=25℃)
Parameter | Symbol | Rating | Unit |
Power Dissipation | Pd | 320 | mV |
Forward Current | IF | 60 | mA |
Peak Forward Current * | IFP | 100 | mA |
Reverse Voltage | VR | 5 | V |
Operating Temperature | Toper | -25~+80 | ℃ |
Storage Temperature | TSgt | -30~+80 | ℃ |
Soldering Temperature | Tsol | 260 (5sec) | ℃ |
* Condition for IFPin pulse of 1/10 duty and1msec width.
★Electrical andOpticalCharacteristics (Ta=25℃)
Parameter | Symbol | Condition | Min | Typ. | Max. | Unit |
Forward Voltage | Vf | IF=60mA | 3.0 | 3.2 | 3.6 | V |
Luminous Intensity | Iv | IF=60mA | 3600 | 4000 | - | mcd |
Reverse Current | IR | VR=5V | - | - |
| uF |
Peak Wave Length | P | IF=60mA |
|
|
| nm |
Dominant Wavelength | d | IF=60mA |
|
|
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|
Chromaticity Coordinates | X | IF=60mA | 0.26 | 0.28 | 0.30 | - |
Y | IF=60mA | 0.24 | 0.27 | 0.30 | - | |
Viewing Angle | 2θ1/2 | IF=60mA | - | 120 | - | deg |
★Typical Electro-Optical Characteristics Curves
Directive Characteristics(Ta=25℃)
★Tapping andPackagingSpecifications (unit: mm)
Note:
★Bin Limits
Intensity Bin Limits (@20mA):
BIN CODE | Min. (mcd) | Max. (mcd) |
H | 5.5 | 8.2 |
J | 8.2 | 12.3 |
K | 12.3 | 18.5 |
L | 18.5 | 28 |
Tolerance for each Bin limit is±15%
Color Bin Limit (@20mA):
BIN CODE | Min. (nm) | Max. (nm) |
3 | 460 | 465 |
4 | 465 | 470 |
5 | 470 | 475 |
6 | 475 | 480 |
Measurement Uncertainty of Luminous Intensity is ±10%
VF Bin Limits (@20mA):
BIN CODE | Min. (V) | Max. (V) |
D | 2.2 | 2.4 |
E | 2.4 | 2.6 |
F | 2.6 | 2.8 |
G | 2.8 | 3.0 |
Measurement Uncertainty of Forward Voltage is ±0.05V.
★BIN: x x x
Measurement Uncertainty of Color Coordinates is ±0.01.
★Reliability Test
Classification | Test Item | Reference Standard | Test Condition | Result |
Endurance Test | Operation Life | MIL-STD-750:1026 MIL-STD-883:1005 JIS-C-7021 :B-1 | Connect with a power if=20mA Ta=Under room temperature Test time=1000,hrs |
0/20 |
High Temperature High Humidity Storage | MIL-STD-202:103B JIS-C-7021 :B-11 | Ta=+65℃±5℃ RH=90%-95% Test time=240hrs |
0/20 | |
High Temperature Storage | MIL-STD-883:1008 JIS-C-7021 :B-10 | High Ta=+85℃±5℃ Test time=1000hrs |
0/20 | |
Low Temperature Storage | JIS-C-7021 :B-12 | Low Ta=-35℃±5℃ Test time=1000hrs | 0/20 | |
Environment Test | Temperature Cycling | MIL-STD-202:107D MIL-STD-750:1051 MIL-STD-883:1010 JIS-C-7021 :A-4 | -35℃~+25℃~+85℃~+25℃ 60min 20min 60min 20min Test time=5cycle |
0/20 |
Thermal Shook | MIL-STD-202:107D MIL-STD-750:1051 MIL-STD-883:1011 | -35℃±5℃~ +85℃±5℃, 20min 20min est time=10cycle |
0/20 | |
Solder Resistance | MIL-STD-202:201A MIL-STD-750:2031 JIS-C-7021 :A-1 | Preheating: 140℃~160℃,within 2 minutes. Operation heating: 260℃(Max),within 10 secs(Max) |
0/20 |
★JudgmentCriteria of Failure for theReliability
Measuring items | Symbol | Measuring condition | Judgment criteria for failure |
Forward Voltage | VF(V) | IF=60mA | Over Ux1.2 |
Reverse current | IR (uA) | VR=5V | OverUx2 |
Luminous intensity | Iv (mcd) | IF=60mA | Belie Sx0.5 |
Note:
★Soldering
Manualof Soldering
Reflow Soldering
★Handing
★Notes forDesigning
★Storage
1) Temperature:5~30℃,Humidity:RH 60% Max.
2) After this bag is opened,devices that will be applied to infrared reflow, vapor-phase reflow,or equivalent soldering process must be :
a) Completed within 168 hours.
b) Stored at less than 30% RH.
3) Devices require baking before mounting,if4aor 4b is not met.
4) If baking is required devices must be baked under below conditions: 48 hours at 60℃±3℃.
★Label of Products
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